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APPLICATION OF EQUIPMENT FOR AUTOMATIC CONTROL OF PLANAR STRUCTURES IN MANUFACTURING MASTER MASKS OF INTEGRATED CIRCUITS ON PHOTO-MASKS

Abstract

Following the concept of defect-free manufacturing of master masks of IC on photo-masks, two Belarusian sets of optomechanical equipment for 0,3 5 p and 90 nanometers are presented in the paper. Each of the sets comprises:  
Multi-channel laser pattern generator;
Automatic mask defect inspection system;
Laser-based mask defect repair system.

The paper contains description of automatic mask defect inspection process during photo-mask manufacturing and respective basic technological operations of the processes.

Advantages of a complex approach to the development of a set of opto-mechanical equipment for defect-free manufacturing of photo-masks have been analyzed in the paper. 

About the Author

S. M. Avakov
Planar
Belarus


References

1. Results from a new die-to-database reticle inspection platform / W. Broadbent [et al.] // Metrology, Inspection and Process Control for Microlithography XXI, Chas N. Archie, Ed., Proc. of SPIE, Vol. 6518: P. 651821, 2007. – P. 1–14.

2. Avakaw, S. High productivity object-oriented defect detection algorithms for the new modular die-to-database reticle inspection platform / S. Avakaw // SPIE. – 2005. – Jun. – V. 5835. – P. 290–299.

3. Avakaw, S. A prospective modular platform of the mask pattern automatic inspection using the die-to-database method / S. Avakaw, A. Korneliuk, A. Tsitko // SPIE. – 2005. – Jun. – V. 5853. – P. 965–976.

4. Kwok-Kit Wong Alfred. Resolution Enhancement Techniques in Optical Lithography / Alfred Kwok-Kit Wong // SPIE PRESS, USA. – 2001. – P. 1–213.

5. Behringer Uwe. Foreword of the 19th European Mask Conference on Mask Technology for Integrated Circuts and Micro-Components. Lectures held at the GMM-Conference. January 13–15, 2003 in Sonthofen / Uwe Behringer. – Germany. – P. 1–2.

6. A complete set of the special process equipment for the defect-free production of reticles. The 23rd European Mask and Lithography Conference EMLC-2007 Janyary 22–25, 2007 / S. Avakaw [et al.]. – Grenoble, France, 2007. – P. 29–30.


Review

For citations:


Avakov S.M. APPLICATION OF EQUIPMENT FOR AUTOMATIC CONTROL OF PLANAR STRUCTURES IN MANUFACTURING MASTER MASKS OF INTEGRATED CIRCUITS ON PHOTO-MASKS. Science & Technique. 2007;(6):64-70. (In Russ.)

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ISSN 2227-1031 (Print)
ISSN 2414-0392 (Online)