<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">sat</journal-id><journal-title-group><journal-title xml:lang="ru">НАУКА и ТЕХНИКА</journal-title><trans-title-group xml:lang="en"><trans-title>Science &amp; Technique</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2227-1031</issn><issn pub-type="epub">2414-0392</issn><publisher><publisher-name>Belarusian National Technical University</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">sat-276</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ПРИБОРОСТРОЕНИЕ, МЕТРОЛОГИЯ И ИНФОРМАЦИОННО-ИЗМЕРИТЕЛЬНЫЕ ПРИБОРЫ И СИСТЕМЫ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>INSTRUMENTATION ENGINEERING, METROLOGY AND INFORMATION MEASURING INSTRUMENTS AND SYSTEMS</subject></subj-group></article-categories><title-group><article-title>ИССЛЕДОВАНИЕ НАКОПЛЕНИЯ ЗАРЯДА СТАТИЧЕСКОГО ЭЛЕКТРИЧЕСТВА НА ПОВЕРХНОСТИ ИЗДЕЛИЙ ИЗ ФТОРОПЛАСТА-4 МЕТОДОМ ВИБРИРУЮЩЕГО КОНДЕНСАТОРА</article-title><trans-title-group xml:lang="en"><trans-title>STUDY OF STATIC ELECTRICITY CHARGE ACCUMULATION ON SURFACE OF FLUOROPOLYMER-4 PRODUCTS USING VIBRATING CAPACITOR METHOD</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Вершина</surname><given-names>Г. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Vershina</surname><given-names>H. А.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Кандидат технических наук, доцент</p></bio><email xlink:type="simple">sat@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Жарин</surname><given-names>А. Л.</given-names></name><name name-style="western" xml:lang="en"><surname>Zharin</surname><given-names>A. L.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Доктор технических наук, профессор</p></bio><email xlink:type="simple">sat@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тявловский</surname><given-names>А. К.</given-names></name><name name-style="western" xml:lang="en"><surname>Tiavlovsky</surname><given-names>A. K.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Кандидат технических наук, доцент</p></bio><email xlink:type="simple">sat@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Белорусский национальный технический университет</institution><country>Беларусь</country></aff><aff xml:lang="en"><institution>Belarusian National Technical University</institution><country>Belarus</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2012</year></pub-date><pub-date pub-type="epub"><day>10</day><month>02</month><year>2012</year></pub-date><volume>0</volume><issue>1</issue><fpage>26</fpage><lpage>32</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Вершина Г.А., Жарин А.Л., Тявловский А.К., 2012</copyright-statement><copyright-year>2012</copyright-year><copyright-holder xml:lang="ru">Вершина Г.А., Жарин А.Л., Тявловский А.К.</copyright-holder><copyright-holder xml:lang="en">Vershina H.А., Zharin A.L., Tiavlovsky A.K.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://sat.bntu.by/jour/article/view/276">https://sat.bntu.by/jour/article/view/276</self-uri><abstract><p>Проведено исследование процессов накопления и стекания поверхностного заряда изделий из фторопласта-4 методом вибрирующего конденсатора. Описана модификация метода измерений, позволяющая регистрировать распределение потенциала поверхности диэлектриков без нарушения заряженного состояния поверхности. Получены графики пространственного распределения поверхностного потенциала изделий из фторопласта-4 после различной обработки. Показано, что термическая обработка (закалка) снижает электризуемость фторопласта-4.</p></abstract><trans-abstract xml:lang="en"><p>The paper presents investigations of processes pertaining to surface charge accumulation and running of fluoropolymer-4 products using vibrating capacitor method. Modification of a measurement technique allowing to register distribution of dielectric surface potential without disturbance of the surface charged state has been described in the paper. The paper contains graphics of spatial distribution of surface potential of fluoropolymer-4 products after various treatments. 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